The Keysight 85050C Precision Mechanical Calibration Kit is an essential tool for engineers and technicians who require accurate and repeatable calibration of vector network analyzers (VNAs) and other high-frequency test equipment. Designed for 7 mm coaxial systems, this kit covers a broad frequency range from DC to 18 GHz, making it suitable for a wide variety of RF and microwave measurement applications.
This precision calibration kit includes open, short, load, and through standards, each manufactured to exacting specifications to ensure minimal measurement uncertainty. With typical precision of ±0.005 dB and repeatability of ±0.002 dB, the 85050C delivers consistent results that enhance the integrity of your measurements. Its temperature stability of ±0.001 dB/°C ensures reliable performance even in fluctuating environmental conditions, reducing the need for frequent recalibration.
Key Features & Highlights
- Frequency Range: DC to 18 GHz – covers a wide spectrum for versatile testing.
- Connector Type: 7 mm – compatible with standard 7 mm coaxial systems.
- Calibration Standards: Includes open, short, load, and through standards for comprehensive calibration.
- High Precision: Typical precision of ±0.005 dB ensures accurate measurements.
- Excellent Repeatability: ±0.002 dB typical for consistent results across calibrations.
- Temperature Stability: ±0.001 dB/°C maintains accuracy in varying conditions.
- Rugged Construction: Built to withstand harsh environments and heavy use for long-term reliability.
Applications
The Keysight 85050C is ideal for use in research and development, manufacturing, and quality control environments where precise high-frequency measurements are critical. It is particularly valuable for calibrating VNAs used in testing components such as filters, amplifiers, and antennas, as well as for characterizing materials and ensuring compliance with industry standards. By providing traceable calibration standards, this kit helps you achieve confidence in your measurement results and improves overall test efficiency.





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