Keithley 7709 Current Data Logger, 6×8 Two-Pole Matrix Module

$700.00

The Keithley 7709 is a two-pole, 6×8 matrix module for current data logging, enabling flexible connection of up to six differential instruments to eight DUT channels. Ideal for complex test systems, it features 300V/1A capacity, low contact resistance, and expandable daisy-chaining.

SKU: MCT_53131231 Category: Tag: Brand:

The Keithley 7709 is a high-performance current data logger module designed for complex test systems requiring flexible signal routing. As part of the Keithley 7700 series, this plug-in module provides a two-pole, 6×8 matrix configuration, allowing you to connect any combination of six differential instrumentation channels to any combination of eight differential device-under-test (DUT) channels. This versatility makes it an essential tool for automated test equipment (ATE), data acquisition, and component characterization.

Key Features & Highlights

  • Flexible Matrix Configuration: 6×8 two-pole matrix enables simultaneous connection of multiple instruments to multiple DUTs, ideal for complex test setups.
  • Wide Instrument Compatibility: Supports AC/DC sources, internal or external meters, oscilloscopes, and more.
  • Expandable Design: Daisy-chain or cascade multiple modules to create larger switch configurations for scalable test systems.
  • Secure Connections: Two female D-sub connectors ensure reliable hook-up and quick tear-down.
  • On-Board Memory: Relay closures are stored in on-board memory for simplified programming and repeatable test sequences.
  • Automatic 2- or 4-Wire Connection: Seamlessly integrates with DMMs for accurate measurements.
  • High Capacity: Rated for 300V, 1A, and 1W per channel, suitable for a wide range of signals.
  • Low Contact Resistance: <1Ω at any path, with additional 1Ω at end of contact life, ensuring minimal signal degradation.
  • Low Offset Current: <100pA per contact pair, preserving low-level signal integrity.

Applications

The Keithley 7709 is ideal for applications requiring flexible signal routing in automated test systems, such as semiconductor device characterization, multi-channel data logging, and production test. Its ability to connect multiple instruments to multiple DUTs makes it particularly useful in R&D labs, quality control, and manufacturing environments where test configurations change frequently.

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