Brand
Keithley
Keithley, now part of Tektronix, is the specialist name in low-level and precision electrical measurement, and this catalogue carries source measure units, bench multimeters, dataloggers and data acquisition systems.
Keithley source measure units are the standard tool for semiconductor and materials characterisation, because sourcing a voltage while measuring picoamp currents in the same feedback loop avoids the timing and grounding problems of separate instruments. For the multimeters, the specification that matters is basic DC accuracy over a stated period and temperature range rather than the digit count on the display.
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The Keithley 2601B System SourceMeter is a single-channel SMU instrument offering 3A DC and 10A pulse current, with 0.012% basic accuracy and 100nV/100pA resolution. Ideal for semiconductor characterization, materials research, and device testing, it combines precision measurement and sourcing in one versatile unit.
The Keithley 2461 SourceMeter is a high-power SMU instrument delivering up to 100 V, 10 A, and 1000 W. Ideal for power electronics, automotive, and semiconductor testing, it offers 0.02% accuracy, 100 nV/100 pA resolution, and a 2400 Graphic Series touchscreen interface.
The Keithley 2635B is a single-channel SourceMeter from the 2600B Series, offering precision sourcing and measurement from 0.1 fA to 10 A. Ideal for advanced characterization and testing, it combines high accuracy with versatile pulse capabilities.
The Keithley 2611B SourceMeter is a single-channel SMU that sources and measures voltage and current with high accuracy (0.01%) and fast speed (1000 readings/s). It delivers 200V and 10A pulses for semiconductor characterization and device testing.
The Keithley 6517B Electrometer/High Resistance Meter measures currents from 10 aA to 20 mA and resistances up to 10 PΩ with 0.05% accuracy. Ideal for semiconductor characterization, insulation testing, and materials research.
The Keithley 3706A is a high-performance 6-slot system switch for the 3700A Series, offering 300V switching and versatile measurement capabilities. Ideal for demanding data acquisition and test applications, it combines accuracy, speed, and flexibility.
The Keithley 7706 plug-in module provides 20 channels of 2-pole or 10 channels of 4-pole multiplexer switching with automatic CJC, ideal for RTD, thermistor, and thermocouple temperature applications. It also features two analog output channels, 16 digital outputs, and an event counter/totalizer for mixed-signal measurements.
The Keithley 2308 is a portable battery/charger simulator designed for testing portable devices. It offers programmable voltage (0-15V), current (0-3A), and power (0-45W), with battery and charger simulation modes, real-time data logging, and remote control. Ideal for R&D and field testing.
The Keithley 2182A Nanovoltmeter delivers ultra-low voltage measurement with 1nV resolution and <1nV/√Hz noise. Ideal for semiconductor characterization, electrochemical studies, and precision metrology, it offers a ±20V range and up to 100 readings/sec. Built-in signal conditioning and GPIB/RS-232 interfaces enhance productivity.
The Keithley 2000-20/E is a high-precision bench multimeter designed for demanding electrical measurements. It offers exceptional accuracy and resolution for voltage, current, and resistance, making it ideal for semiconductor testing and device characterization. Enhance your measurement capabilities with this reliable industrial instrument.
The Keithley 2308 is a dual-channel source measure unit (SMU) optimized for battery-powered device testing. It features ultra-fast response to pulsed loads, variable output resistance, and 100nA current sensitivity for precise characterization of portable electronics.
The Keithley 2450 Graphical Series SourceMeter SMU combines a precision voltage/current source and high-resolution measurement in one instrument. With 1000V/1A/100W output, 0.012% basic accuracy, and 5.5-digit resolution, it features an intuitive graphical interface for efficient semiconductor characterization and device testing.