Keithley 2000/2000-SCAN: Precision Digital Multimeter with Scanning Capability
The Keithley 2000/2000-SCAN is a precision digital multimeter designed for demanding measurement applications in research, development, and manufacturing. Combining high accuracy with versatile measurement functions and optional scanning capability, this instrument provides a comprehensive solution for characterizing electronic devices and materials.
Key Features & Highlights
- High Accuracy: Achieve reliable measurements with basic accuracy of up to 0.0025% for voltage, current, and resistance.
- Fast Sampling: Capture transient signals with sampling rates up to 1 MS/s, ideal for dynamic testing.
- Advanced Filtering: Reduce noise and drift with built-in filtering and averaging techniques for stable readings.
- Versatile Measurement Modes: Measure DC, AC, and pulsed signals; perform 4-wire resistance measurements for low-resistance accuracy.
- Source and Measure: Source voltage or current for device characterization and testing, functioning as a source measure unit (SMU).
- Scanning Capability (2000-SCAN): Automate multi-channel measurements with the optional scanner module, enabling simultaneous testing of multiple devices or points.
- Trigger Synchronization: Synchronize measurements with external triggers for precise timing in automated test systems.
- Data Management: Capture and store large datasets; export in various formats for analysis and reporting.
- User-Friendly Interface: Navigate via the intuitive front panel or PC software; create custom test sequences and automate analysis.
Applications
The Keithley 2000/2000-SCAN is well-suited for a variety of applications, including:
- Semiconductor device characterization (I-V curves, breakdown voltage, leakage current)
- Component testing (resistors, capacitors, diodes, transistors)
- Material research and development
- Production test and quality control
- Educational laboratories
With its precision, versatility, and automation capabilities, the Keithley 2000/2000-SCAN enhances productivity and ensures reliable results in the most demanding measurement environments.





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