Keysight B2901B Precision Source Measure Unit, 100fA Resolution, 210V/3A/10.5A Pulse

$6,238.00

The Keysight B2901B Precision Source Measure Unit (SMU) delivers 100fA resolution, 210V/3A/10.5A pulse capability, and 4-quadrant operation for advanced device characterization. With built-in pulse generator and USB, LAN, and GPIB interfaces, it offers unmatched precision and versatility for R&D and production testing.

Keysight B2901B Precision Source Measure Unit

The Keysight B2901B Precision Source Measure Unit (SMU) is a state-of-the-art instrument designed for advanced device characterization in research, development, and production environments. With its exceptional 100fA current resolution, 210V/3A/10.5A pulse capabilities, and comprehensive feature set, the B2901B empowers engineers and scientists to achieve precise, repeatable measurements across a wide range of applications.

Key Features & Highlights

  • Ultra-High Resolution: 100fA current resolution enables precise characterization of low-current devices such as transistors, sensors, and nanomaterials.
  • Wide Dynamic Range: 210V voltage sourcing and 3A continuous / 10.5A pulsed current sourcing accommodate diverse devices from low-power electronics to high-power semiconductors.
  • Fast Pulse Capabilities: 10ns rise/fall time and 100ns minimum pulse width allow accurate transient and dynamic behavior testing.
  • 4-Quadrant Operation: Full source and sink capability for both voltage and current, ideal for solar cells, batteries, and power semiconductors.
  • Built-in Pulse Generator: Integrated pulse generation simplifies setup and reduces external equipment needs.
  • Versatile Measurement Modes: DC, pulsed, and swept measurements provide flexibility for various testing scenarios.
  • Intuitive User Interface: Large touchscreen display simplifies configuration and operation.
  • Remote Control Interfaces: USB, LAN, and GPIB enable seamless integration into automated test systems.

Applications

The Keysight B2901B is ideal for characterizing semiconductor devices, LEDs, photodetectors, sensors, and battery cells. It is also well-suited for reliability testing, failure analysis, and material research where high resolution and fast pulse capabilities are critical.

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