The Keithley 2601B-PULSE Source Measure Unit (SMU) is a high-performance instrument that integrates a precision voltage/current source with a sensitive measurement unit, designed for demanding applications in semiconductor characterization, device testing, and material analysis. With a wide dynamic range of 0 to 40 V and 0 to 10 A, and pulse capabilities as fast as 10 ns, this SMU enables rapid, accurate testing of high-speed devices and high-power components.
Key Features & Highlights
- High-Speed Pulsing: Generate pulses with rise/fall times as fast as 10 ns, ideal for testing high-speed devices and transient responses.
- Wide Dynamic Range: Voltage range of 0 to 40 V and current range of 0 to 10 A accommodate a broad spectrum of devices, from low-power semiconductors to high-power batteries.
- Precision Measurements: Achieve high accuracy with resolution down to 100 nV and 100 pA, ensuring reliable and repeatable results.
- Flexible Pulse Control: Adjustable pulse width from 10 ns to 100 ms and repetition rates from 1 Hz to 1 MHz provide versatility for various test scenarios.
- Intuitive Interface: User-friendly operation simplifies setup and execution, reducing training time and increasing productivity.
Applications
- Semiconductor device characterization (e.g., MOSFETs, diodes, LEDs)
- Battery testing and evaluation
- Material research and analysis
- Reliability and stress testing
The Keithley 2601B-PULSE is an essential tool for engineers and technicians seeking to reduce test time, improve measurement accuracy, and enhance overall productivity in R&D and production environments.
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